Professor, Chemical and Biomedical Engineering, FAMU-FSU College of Engineering, Tallahassee, Florida. (2008-present)
Faculty affiliate, National High Magnetic Field Laboratory, Condensed Matter Science, Florida State University, Tallahassee, Florida.
Member of Department Graduate Committee
Professor of Solid State Chemistry, Materials Chemistry, Lund University, Lund, Sweden (1998-2000)
Member of Technical Staff, Lucent Technologies, Bell Laboratories, Murray Hill, NJ (1986-1998, 2000-2008)
Research Associate at the Solid State Chemistry Group, National Research Council of Canada, Ottawa. (1985-1986)
Postdoctoral position at IBM T.J. Watson Research Center, Yorktown Heights, NY (1983-1984)
American Physical Society
American Chemical Society
Fellow of the American Physical Society (2006)
Humboldt Research Fellow (Alexander von Humboldt Foundation, Germany, 2008)
F. Hulliger and T. Siegrist, Low-Temperature Phase-Transitions in GdS, GdSe and GdTe, Zeitschrift für Physik B-Condensed Matter, 35 (1979), pp. 81-90.
F. Hulliger and T. Siegrist, The Crystal-Structure of GeAsSe, Materials Research Bulletin, 16 (1981), pp. 1245-1251.
F. Hulliger and T. Siegrist, The Crystal-Structures of BaSe2 and BaSe3, Zeitschrift für Naturforschung Section B-a Journal of Chemical Sciences, 36 (1981), pp. 14-15.
L. Schlapbach, T. Siegrist and C. Pinaperez, Th7Fe3, a Superconductor, Which Becomes Ferromagnetic through Hydrogen Absorption, Helvetica Physica Acta, 54 (1981), pp. 613-613.
L. Schlapbach, C. Pinaperez and T. Siegrist, Hydrogen Absorption by Th7Fe3 and the Related Magnetic, Structural and Surface-Properties, Solid State Communications, 41 (1982), pp. 135-138.
T. Siegrist and R. Wessicken, Electron-Microscopy Structural Illustration of the Layer Structure of GeAsSe, Helvetica Physica Acta, 55 (1982), pp. 132-132.
T. Siegrist, W. Petter and F. Hulliger, Samarium Pyrosilicate Sulfide, Sm4S3Si2O7, Acta Crystallographica Section B-Structural Science, 38 (1982), pp. 2872-2874.
T. Siegrist and R. Wessicken, High-Resolution Electron-Microscopy Study of GeAsSe, Materials Research Bulletin, 17 (1982), pp. 351-354.
F. Hulliger, H. R. Ott and T. Siegrist, Low-Temperature Behavior of HoBi, Journal of the Less-Common Metals, 94 (1983), pp. 270-270.
T. Siegrist, F. Hulliger and G. Travaglini, The Crystal-Structure and some Properties of ReSi2, Journal of the Less-Common Metals, 92 (1983), pp. 119-129.